2022-10-30 17:44 Tags: # DAC and ADC Metrics For ADCs and DACs we need a number of metrics to explain their behaviour. ## Digital-to-analogue Converter $B_{in}=b_{N-1}\cdot\frac{1}{2}+b_{N-2}\cdot\frac{1}{4}+...+b_{0}\cdot\frac{1}{2^N}$ (where $b_0$ is the least significant bit (LSB)). $V_{out} = B_{in}\cdot V_{ref}$ or $I_{out} = B_{in}\cdot I_{ref}$. $0V < V_{out} < (1-\frac{1}{2^N})V_{ref}$ $V_{LSB} = \frac{V_{ref}}{2^N}$ ### Signed representation - Two's Complement $B_{in, complement}=b_{N-1}\cdot(-\frac{1}{2})+b_{N-2}\cdot\frac{1}{4}+...+b_{0}\cdot\frac{1}{2^N}$ This range then becomes minus half the reference to one LSB less than half the reference $-\frac{1}{2}V_{ref}<V_{out}<(\frac{1}{2}-\frac{1}{2^N})V_{ref}$ ## Analogue to Digital Converter $0V \leq V_{in} < V_{ref}$ $B_{out}=b_{N-1}\cdot\frac{1}{2}+b_{N-2}\cdot\frac{1}{4}+...+b_{0}\cdot\frac{1}{2^N}$ For proper conversion, the output binary number must be chosen such that $B_{ref}\cdot V_{ref}=V_{in}+V_X$ where the error voltage $V_X$ is in the range $-\frac{1}{2}V_{LSB}\leq V_X\leq\frac{1}{2}V_{LSB}$. ![](attachments/DAC%20and%20ADC%20Metrics.png#invert) The transistion point chosen here will have zero offset (desirable). We want the proportional line to go through the middle of all the levels. ![](attachments/DAC%20and%20ADC%20Metrics-1.png#invert) ## Converter Non-idealities Ideally the transfer function should be a straight line (when we zoom out far enough that we can't see the levels). ![](attachments/DAC%20and%20ADC%20Metrics-2.png#invert) ### Gain Error Angle of slope is not 45 degrees. ![](attachments/DAC%20and%20ADC%20Metrics-3.png#invert) Often doesn't matter because many systems have unknown gain in their signal processing path. ### Offset Error ![](attachments/DAC%20and%20ADC%20Metrics-4.png#invert) Often these are not important! Offset doesn't matter because we are using AC signals so the DC value or the offset doesn't matter. ## Non-linearity Always important! ### [Integral non-linearity](integral%20non-linearity.md) ![](attachments/DAC%20and%20ADC%20Metrics-5.png#invert) The [integral non-linearity](integral%20non-linearity.md) is measured in LSB's. e.g. a DAC would have an [INL](integral%20non-linearity.md) of $V_{max}/V_{LSB}$. ![](attachments/DAC%20and%20ADC%20Metrics-6.png#invert) #### Zoomed in view of [INL](integral%20non-linearity.md) (fine grain) Ideal spacing is one $V_{LSB}$. Leads to the [Differential Non-linearity](#Differential%20Non-linearity) ### Differential Non-linearity see [Differential Non-linearity](Differential%20Non-linearity.md) Gives an idea of the difference per datapoint. ## Dynamic Properties ### ADC Conversion Time = $1/f_{sample}$ ### DAC Settling Time (typically high precision) Time from input change to settling within 1/2 an LSB ![](attachments/DAC%20and%20ADC%20Metrics-8.png#invert) Worst case is for a [[Full Scale Range (FSR) Change]]. 0000 -> 1111 Assume settling is a first order LPF ($V_{ref}\cdot e^{-\frac{t}{\tau}}$) $V_{err}=\frac{1}{4} V_{LSB}$ implies $e^{-\frac{t}{\tau}}=2^{-N-2}$, so $t_{settle}=\tau\cdot(N+2)\cdot ln(2)$ So more bits means we will need to wait longer for it to settle. [^1] --- # References [^1]: [vr-4602-wk06-sc06-dacadcmetrics](../../Spaces/University/ELEC4602%20–%20Microelectronics%20Design%20and%20Technology/Lectures/W7/vr-4602-wk06-sc06-dacadcmetrics.mp4)